We are proud to announce the release of GrainMapper3D version 2.1, which is even faster and more intuitive than it’s predecessor. Through the LabDCT™ module for the ZEISS Xradia 520/620 Versa X-ray Microscopes, GrainMapper3D version 2.1 gives access to 3D maps of grain orientations and morphologies in polycrystalline materials and enables correlation with complimentary information on e.g. cracks, porosities and inclusions – non-destructively.
Highlighted features of GrainMapper3D version 2.1
- Self-calibration of instrument parameters based on the active data set, leading to higher efficiency and sensitivity
- Forward projection of reconstructed grains onto raw detector images for better evaluation of map fidelity in terms of grain shape and completeness
- Convergence metrics providing the user with a better grasp and control of the reconstruction progress
With the release of GrainMapper3D version 2.1, non-destructive 3D crystallographic imaging in your home lab was never easier!
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