GrainMapper3D version 2.1

We are proud to announce the release of GrainMapper3D version 2.1, which is even faster and more intuitive than it’s predecessor. Through the LabDCT™ module for the ZEISS Xradia 520/620 Versa X-ray Microscopes, GrainMapper3D version 2.1 gives access to 3D maps of grain orientations and morphologies in polycrystalline materials and enables correlation with complimentary information on e.g. cracks, porosities and inclusions – non-destructively.

Highlighted features of GrainMapper3D version 2.1

 

• Self-calibration of instrument parameters based on the active data set, leading to higher efficiency and sensitivity
• Forward projection of reconstructed grains onto raw detector images for better evaluation of map fidelity in terms of grain shape and completeness
• Convergence metrics providing the user with a better grasp and control of the reconstruction progress

With the release of GrainMapper3D version 2.1, non-destructive 3D crystallographic imaging in your home lab was never easier!

 

For more information please contact support@xnovotech.com