Welcome to Mie Elholm Birkbak

It’s a pleasure to welcome Mie Birkbak to the Xnovo team.

Mie holds a PhD in Nanoscience from Aarhus University and has expertise in combining diffraction and imaging techniques to tackle scientific questions within the field of materials science.

She has worked on a multitude of different large-scale x-ray facilities throughout the world and has a broad knowledge of modern 3D imaging techniques.

We look forward to the collaboration!