New Colleague Xnovo

Welcome to Mie Elholm Birkbak

It’s a pleasure to welcome Mie to the Xnovo-team. Mie holds a PhD in Nanoscience from Aarhus University and has expertise in combining diffraction and imaging techniques to tackle scientific questions within the field of materials science. She has wo… Read more
New colleague at Xnovo

Welcome to Andreas Pedersen

We are happy to announce that Andreas Pedersen has joined the Xnovo team as a Software Developer. Andreas has a scientific background within method development, simulations, and analysis of solid materials with atomistic resolution, and he has more t… Read more
Zeiss collaboration

Xnovo extends strategic partnership with ZEISS

For the last two years, the Xnovo GrainMapper3D software has provided ZEISS’ Xradia 520 Versa with the possibility to study grain orientation information and combine the data with microstructural features such as cracks, porosity, and inclusions. We… Read more
Grainmapper3D in Nature Scientific Reports

Xnovo’s technology in Nature Scientific Reports

For the first time in history, a group of researchers has been able to quantify simultaneously the orientation of individual grains and the grain growth/shrinkage kinetics during sintering of copper. The tracking of grains was made possible by Xnovo’… Read more