Xnovo LabDCT GrainMapper3D Silicon Grain Boundaries

New Acta Materialia publication featuring LabDCT

By using a combination of LabDCT, attenuation-based tomography and electron microscopy, a group of researchers headed by professor Ashwin Shahani from Michigan State University have investigated the correlation between grain boundaries and impurity p… Read more

Welcome to Christian Holzner

It’s a pleasure to welcome Christian Holzner to the Xnovo team as our Director of Product and Business Development. Christian comes from a position as Innovation Manager from the California Bay Area based Carl Zeiss X-ray Microscopy (formerly Xradia… Read more
Steven Clauwaert

Welcome to Steven Clauwaert

We are happy to announce that Steven Clauwaert has joined the Xnovo team as our Software Manager. Steven’s principal function is day-to-day management of software related issues within development, navigation, design, and processes. He brings along b… Read more
DanMAX 2018

3rd DanMAX Users Meeting

The 3rd DanMAX Users Meeting was held at MAX IV in Lund on 8-9 January 2018. X-ray scientists from Danish universities and industry met to present and discuss the science they want to do once the beamline is operational. Mie Birkbak represented Xnovo… Read more
Mie Birkbak

Welcome to Mie Elholm Birkbak

It’s a pleasure to welcome Mie Birkbak to the Xnovo team. Mie holds a PhD in Nanoscience from Aarhus University and has expertise in combining diffraction and imaging techniques to tackle scientific questions within the field of materials science. Sh… Read more
Andreas Pedersen

Welcome to Andreas Pedersen

We are happy to announce that Andreas Pedersen has joined the Xnovo team as a Software Developer. Andreas has a scientific background within method development, simulations, and analysis of solid materials with atomistic resolution, and he has more t… Read more

Xnovo extends strategic partnership with ZEISS

For the last two years, the Xnovo GrainMapper3D software has provided ZEISS’ Xradia 520 Versa with the possibility to study grain orientation information and combine the data with microstructural features such as cracks, porosity, and inclusions. We… Read more

Xnovo’s technology in Nature Scientific Reports

For the first time in history, a group of researchers has been able to quantify simultaneously the orientation of individual grains and the grain growth/shrinkage kinetics during sintering of copper. The tracking of grains was made possible by Xnovo’… Read more

Xnovo announces GrainMapper3D™ in partnership with…

Materials Science Breakthrough: Synchrotron Imaging Capabilities now Available at Laboratory Scale Non-destructive 3D crystallographic imaging is now possible with new GrainMapper3D technology from Xnovo Technology ApS Køge, Denmark, July 29, 2015 –… Read more