Meet us at ICTMS 2019

Xnovo will be attending ICTMS 2019 and you can learn about our technology through the talk:

Mapping Grain Morphology and Grain Orientation by Laboratory Diffraction Contrast Tomography

Erik Lauridsen
Advances in tomographic reconstruction and analysis

Visit ICTMS 2019, 22-26 July 2019, Cairns, Australia, program