Meet us at XTOP2018

August 08, 2018

Xnovo will be attending the 14th Biannual Conference on High-Resolution X-Ray Diffraction and Imaging, XTOP2018. Learn more about our technology from the talk:

Nondestructive Materials Characterization in 3D by Laboratory Diffraction Contrast Tomography – Applications and Future Directions

Erik Lauridsen
Session 8: Industrial Applications with X-ray Diffraction
Thursday September 6th at 15:30-16:00

XTOP2018, 3-7 September 2018, Bari, Italy, see full program

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