Frontiers in non-destructive 3D grain mapping in the laboratory
Want to learn how X-rays can be used for mapping grains in 3D non-destructively in a home laboratory? This webinar will highlight the significance of true sample representivity and how new non-destructive methods can address this critical challenge. Emphasis will be on what future directions lab-based DCT and other grain mapping workflows hold for materials science and how destructive and non-destructive approaches can be combined to gain unique insights.
The webinar is intended for researchers and students working in the field of materials science and focusing on grain imaging
Speakers: Hrishikesh Bale, Carl Zeiss X-ray Microscopy Inc. & Erik Lauridsen, Xnovo
May 6, 2021, 16:00 CEST | 10:00 EDT
The webinar is free of charge – registration required