We are proud to announce the release of GrainMapper3D version 2.2, which is even faster and more intuitive than it’s predecessor. Through the LabDCT™ module for the ZEISS Xradia 520/620 Versa X-ray Microscopes, GrainMapper3D version 2.2 gives access to 3D maps of grain orientations and morphologies in polycrystalline materials and enables correlation with complimentary information on e.g. cracks, porosities and inclusions – non-destructively.
Highlighted features of GrainMapper3D version 2.2
- Advanced segmentation – with the option to combine segmentation recipes – for better extraction of diffraction peaks and their shapes, leading to grain maps with higher completeness and sharper grain boundaries
- Up to 40 % faster time to results – an optimized engine and memory handling make it possible
- Tailored user preferences for e.g. data paths, visualization settings and storage options enabling each user to work more efficiently and consistently
With the release of GrainMapper3D version 2.2, non-destructive 3D crystallographic imaging in your home lab was never easier!