For the last two years, the Xnovo GrainMapper3D software has provided ZEISS’ Xradia 520 Versa with the possibility to study grain orientation information and combine the data with microstructural features such as cracks, porosity, and inclusions. We… Read more

For the first time in history, a group of researchers has been able to quantify simultaneously the orientation of individual grains and the grain growth/shrinkage kinetics during sintering of copper. The tracking of grains was made possible by Xnovo’… Read more

Materials Science Breakthrough: Synchrotron Imaging Capabilities now Available at Laboratory Scale Non-destructive 3D crystallographic imaging is now possible with new GrainMapper3D technology from Xnovo Technology ApS Køge, Denmark, July 29, 2015 –… Read more